Title of Dataset: Chemical Interface Damping by Electrochemical Gold Oxidation Experimental Data
DOI: https://doi.org/10.15480/882.9080
Handle: https://hdl.handle.net/11420/45192

Creators: 
Maurice Pfeiffer (e-mail: maurice.pfeiffer@tuhh.de, orcid: 0009-0002-3767-6672), Institute of Optical and ELectronic Material, Hamburg Technical University, Hamburg, Germany
Xinyan Wu, Institute of Optical and ELectronic Material, Hamburg Technical University, Hamburg, Germany
Fatemeh Ebrahimi, Institute of Optical and ELectronic Material, Hamburg Technical University, Germany and Institute of Functional Materials for Sustainability, Helmholtz-Zentrum Hereon, Geesthacht, Germany
Nadiia Mameka, Institute of Materials Mechanics, Helmholtz-Zentrum Hereon, Geesthacht, Germany
Manfred Eich, Institute of Optical and ELectronic Material, Hamburg Technical University, Hamburg, Germany and Institute of Functional Materials for Sustainability, Helmholtz-Zentrum Hereon, Geesthacht, Germany 
Alexander Petrov, Institute of Optical and ELectronic Material, Hamburg Technical University, Hamburg, Germany and Institute of Functional Materials for Sustainability, Helmholtz-Zentrum Hereon, Geesthacht, Germany 

Data context: This dataset contains the experimental data underlying the "Chemical Interface Damping by Electrochemical Gold Oxidation" manuscript.

Experimental Method: Optical measurements by Semilab SE-2000 Ellipsometer and electrochemical measurements by Gamry Interface 1010E. Details in the corresponding manuscript.

Data description:
AuUFs9_CID_duringCV2_dataexport.h5 contains data from the experiment with 11 CV scans at 10 mV/s scan rate between 0.8 V vs. RHE and 1.7 V vs. RHE. This data corresponds to Figure 1 of the supporting information.
AuUFs9_CID_duringCV3_dataexport.h5 contains data from the experiment with 2 CV scans at 1 mV/s scan rate between 0.8 V vs. RHE and 1.7 V vs. RHE. This data corresponds to Figure 2 and 3 of the main text and Figure 2 and 3 of the supporting information.
AuUFs9_CID_duringCV4_dataexport.h5 contains data from the experiment with 1 CV scans at 1 mV/s scan rate between 0.8 V vs. RHE and 2 V vs. RHE. This data corresponds to Figure 4 of the main text and Figure 4 and 5 of the supporting information.
AuUFs9_oxidecheck_CID_duringCV2_dataexport.h5 corresponds to Figure 6 and 7 of the supporting information.
AuUFs9_oxidecheck_CID_duringCV3_dataexport.h5 corresponds to Figure 8 and 9 of the supporting information.
spAu11_CID_duringCV2_dataexport.h5 corresponds to Figure 10 and 11 of the supporting information.
spAu11_CID_duringCV3_dataexport.h5 corresponds to Figure 12 and 13 of the supporting information.

Each hdf5 dataset contains the following information:
Potentiostat_Time_s, Potentiastat_Potential_mV_to_RHE, Potentiostat_Current_A: Measured data of electrochemical experiment
Time_at_Ellipsometry_measurement_s: Corresponding times of ellipsometry measurements to electrochemical experiment
Potential_at_Ellipsometry_measurement_mV_to_RHE: Corresponding potentials of ellipsometry measurements to electrochemical experiment
Wavelength_eV: Wavelength in electronvolt for each Psi and Delta measurement point of the ellipsometer
Psi, Delta: Raw ellipsometry data as matrix for each wavelength and timed measurement point (see Time_at_Ellipsometry_measurement_s and Potential_at_Ellipsometry_measurement_mV_to_RHE) of optical experiment
fitted_collision_frequency_meV, fitted_oxide_thickness_nm: fitted values for each ellipsometry measurment based on Psi and Delta values