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  4. Single-probe near-field phase retrieval using on-the-fly scan and Hilbert transform
 
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Single-probe near-field phase retrieval using on-the-fly scan and Hilbert transform

Publikationstyp
Conference Paper
Date Issued
2023
Sprache
English
Author(s)
Yang, Cheng  
Theoretische Elektrotechnik E-18  
Adam, Christian  orcid-logo
Integrierte Schaltungen E-9  
Götschel, Sebastian  orcid-logo
Mathematik E-10  
TORE-URI
https://hdl.handle.net/11420/44060
Citation
International Symposium on Electromagnetic Compatibility (EMC Europe 2023)
Contribution to Conference
IEEE International Symposium on Electromagnetic Compatibility, EMC Europe 2023  
Publisher DOI
10.1109/EMCEurope57790.2023.10274183
Scopus ID
2-s2.0-85174579233
Publisher
IEEE
ISBN
979-8350-3240-0-6
A novel near-field measurement method is proposed for fast phase retrieval using a single probe. The method is based on a new understanding of the on-the-fly (OTF) scan process as a spatio-temporal sampling operation of near-field responses. As a result, the near-field measurement is interpreted as a signal modulation of a source signal and a variable spatio-temporal function defined by the field responses and the motion of the probe. To retrieve the complex field responses, the Hilbert Transform (HT) is utilized for envelope and phase demodulation of signals recorded by an oscilloscope. To demonstrate the proof of concept, both numerical and experimental examples are provided with a detailed description of the method implementation. Measurement-to-measurement correlations at 125 kHz are conducted using a six-axis industry robot with multiple probes and instruments, showing its efficiency, effectiveness, and flexibility. Compared to conventional near-field measurement methods, the proposed method allows 90% reduction of measurement time and achieves a relative accuracy of phase retrieval above 96% with a simplified measurement setup, opening up new opportunities for near-field measurement applications.
Subjects
Hilbert transform
Near-field phase
on-the-fly scan
signal demodulation
single-probe
DDC Class
510: Mathematics
621: Applied Physics
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