Publisher DOI: 10.1109/MetaMaterials.2016.7746520
Title: Extension of the contour integral method for the modeling of TE scattering in two-dimensional photonic structures using the duality principle
Language: English
Authors: Preibisch, Jan 
Schuster, Christian 
Issue Date: 16-Nov-2016
Publisher: IEEE
Source: 10th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2016: 7746520, 292-294 (2016-11-16)
Abstract (english): The Contour Integral Method (CIM) is a numerically efficient modeling technique for planar or infinitely extended two-dimensional (2-D) structures. In the optical regime, the CIM has already been adapted and applied for the modeling of TM0z-mode scattering in photonic crystals. In this work the dual case of TE0z-mode scattering is addressed. Making use of the duality principle, expressions for the behavior of the TE0z-mode can be derived from the system matrices associated with the TE0z-mode. This allows to reuse use formulas and program code written for the TE0z-mode with minimal adjustments. The results are validated by comparison to full-wave simulations.
Conference: 10th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2016; 
URI: http://hdl.handle.net/11420/5246
ISBN: 978-1-5090-1803-1
Institute: Theoretische Elektrotechnik E-18 
Type: InProceedings (Aufsatz / Paper einer Konferenz etc.)
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