Please use this identifier to cite or link to this item: https://doi.org/10.15480/882.743
Title: Zuverlässigkeit von keramischen Mehrlagensubstraten
Other Titles: Reliability model for thick film resistors
Language: German
Authors: Dorsch, Niko Sebastian 
Keywords: Dickschichtwiderstände;unterkritisches Risswachstum;funktionelles Versagen;subcritical crack growth;resistor;reliability;crack growth simulation
Issue Date: 2010
Abstract (german): Ein Zuverlässigkeitsmodell für Dickschichtwiderstände wird vorgestellt, welches die Widerstandsänderung aufgrund wachsender Mikrorisse beschreibt. Die zeitabhängige Ausfallwahrscheinlichkeit wird unter Beachtung statistisch streuender Eingangsparameter berechnet. Gezeigt werden die Berechnungsprozedur, eine Finite-Elemente-Risswachstumsberechnung, Methoden zur Charakterisierung von Dickschichtmaterialien und ein Verifikationsexperiment. Die Ausfallwahrscheinlichkeit aktueller Dickschichtwiderstände ist vernachlässigbar klein.
Abstract (english): This PhD thesis describes a reliability model for thick film resistors. Microcracks existing inside the resistor may grow due to mechanical stresses. Because of a high glass portion in the material, pronounced subcritical crack growth can be observed. Not the crack growth itself, but the resistance change caused by the crack growth leads to the failure of the resistor. The developed reliability model describes this functional failure of the resistor, taking into account statistically distributed input parameters. The result of the reliability calculation is the failure probability as a function of time. A calculation procedure for the time dependent failure probability, a finite element crack growth simulation, material characterisation methods for thick film materials and a verification experiment for the time dependent failure of the resistors is shown. The tolerance range of the calculated lifetimes is estimated by studying the influence of different input parameters. Due to the brittle material behaviour the lifetime of thick film resistors can only be calculated in the range of some orders of magnitude. For currently used thick film resistors under usual operating load conditions the failure probability is negligibly small.
URI: http://tubdok.tub.tuhh.de/handle/11420/745
DOI: 10.15480/882.743
Institute: Keramische Hochleistungswerkstoffe M-9 
Faculty: Maschinenbau
Type: Dissertation
Advisor: Schneider, Gerold A. 
Thesis grantor: Technische Universität Hamburg
Appears in Collections:Publications (tub.dok)

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