Sahli, R.R.SahliPallares, G.G.PallaresPapangelo, A.A.PapangeloCiavarella, M.M.CiavarellaDucottet, C.C.DucottetPonthus, N.N.PonthusScheibert, J.J.Scheibert2021-11-102021-11-102019-05-30Physical Review Letters 122 (21): 214301 (2019)http://hdl.handle.net/11420/10864True contact between randomly rough solids consists of myriad individual microjunctions. While their total area controls the adhesive friction force of the interface, other macroscopic features, including viscoelastic friction, wear, stiffness, and electric resistance, also strongly depend on the size and shape of individual microjunctions. We show that, in rough elastomer contacts, the shape of microjunctions significantly varies as a function of the shear force applied to the interface. This process leads to a growth of anisotropy of the overall contact interface, which saturates in the macroscopic sliding regime. We show that smooth sphere-plane contacts have the same shear-induced anisotropic behavior as individual microjunctions, with a common scaling law over 4 orders of magnitude in the initial area. We discuss the physical origin of the observations in light of a fracture-based adhesive contact mechanics model, described in the companion article, which captures the smooth sphere-plane measurements. Our results shed light on a generic, overlooked source of anisotropy in rough elastic contacts, not taken into account in current rough contact mechanics models.en1079-7114201921American Institute of Physicshttp://rightsstatements.org/vocab/InC/1.0/PhysikJournal Article10.15480/882.420310.1103/PhysRevLett.122.21430110.15480/882.420331283347To cite this version: R. Sahli, G. Pallares, A. Papangelo, M. Ciavarella, C. Ducottet, N. Ponthus, and J. Scheibert. Shear-Induced Anisotropy in Rough Elastomer Contact. Physical Review Letters, American Physical Society, 2019, 122 (21), pp. 214301. 10.1103/PhysRevLett.122.214301Journal Article