Fitting, Hans-JoachimHans-JoachimFittingKovacs, Josef-ZoltanJosef-ZoltanKovacs2020-03-202020-03-202009-07Microscopy and Microanalysis SUPPL. 2 (15): 1106-1107 (2009)http://hdl.handle.net/11420/5440en1435-8115Microscopy and microanalysis2009SUPPL. 211061107Cambridge University PressPhysikSEM contrast of semi-insulating compound materialsJournal Article10.1017/S1431927609092162Other