Preibisch, JanJanPreibischDuan, XiaominXiaominDuanSchuster, ChristianChristianSchuster2020-10-082020-10-0820132013 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS) : 16 - 21 Sept. 2013, Bordeaux, France / IEEE. - Piscataway, NJ : IEEE, 2013. - Art.-Nr. 6809097 i.e. Seite 493-495http://hdl.handle.net/11420/7498We present an extension to the contour integral method (CIM) for the treatment of two-dimensional scattering problems from circular inclusions with plane wave excitation. CIM is an integral equation approach to planar problems whose efficiency can be greatly enhanced by semi-analytical treatment of circular scatterers. It is related to the boundary element method (BEM) and shows promising domain decomposition capabilities. The performance and accuracy is compared to the full-wave finite integral technique (FIT) by studying the scattering of an array of dielectric rods. © 2013 IEEE.enPhysikTechnikIngenieurwissenschaftenConference Paper10.1109/MetaMaterials.2013.6809097Other