Jenihhin, M.M.JenihhinRaik, J.J.RaikJutman, A.A.JutmanCherezova, N.N.CherezovaUbar, R.R.UbarMiclea, L.L.MicleaEnyedi, S.S.EnyediStefan, I.I.StefanStan, O.O.StanCorches, C.C.CorchesPeng, Z.Z.PengEles, P.P.ElesDrechsler, R.R.DrechslerEggersglus, S.S.EggersglusFey, GörschwinGörschwinFeyGlowatz, A.A.GlowatzTille, D.D.TilleGielen, G.G.GielenCoyette, A.A.CoyetteDobbelaere, W.W.DobbelaereVanhooren, R.R.VanhoorenChuang, P. Y.P. Y.ChuangMarinissen, E. J.E. J.MarinissenDi Natale, G.G.Di NataleBarragan, M.M.BarraganMaistri, P.P.MaistriMir, S.S.MirVatajelu, E. I.E. I.VatajeluBernardi, P.P.BernardiDi Carlo, S.S.Di CarloPrinetto, P.P.PrinettoSonza Reorda, M.M.Sonza ReordaViolante, M.M.ViolanteStratigopoulos, H. G.H. G.StratigopoulosMichael, M. K.M. K.MichaelNeophytou, S.S.NeophytouHadjitheophanous, S.S.HadjitheophanousChristou, K.K.ChristouSkitsas, M.M.SkitsasBosio, A.A.BosioDeveautour, B.B.DeveautourGirard, P.P.GirardTraiola, M.M.TraiolaVirazel, A.A.VirazelFernandes Dos Santos, F.F.Fernandes Dos SantosKritikakou, A.A.KritikakouCasagranda, G.G.CasagrandaVallero, M.M.ValleroVella, F.F.VellaRech, P.P.RechBolzani Poehls, L. M.L. M.Bolzani PoehlsKrstic, M.M.KrsticAndjelkovic, M.M.AndjelkovicVargas, F.F.VargasTshagharyan, G.G.TshagharyanHarutyunyan, G.G.HarutyunyanVardanian, V.V.VardanianShoukourian, S.S.ShoukourianZorian, Y.Y.ZorianDworak, J.J.DworakNepal, K.K.NepalManikas, T.T.ManikasTaouil, M.M.TaouilFieback, M.M.FiebackGebregiorgis, A.A.GebregiorgisBishnoi, R.R.BishnoiHamdioui, S.S.HamdiouiChatterjee, A.A.ChatterjeeSaha, A.A.SahaKomarraju, S.S.KomarrajuMa, K.K.MaAmarnath, C.C.AmarnathTahoori, M.M.TahooriMayahinia, M.M.MayahiniaRajabalipanah, M.M.RajabalipanahBasharkhah, K.K.BasharkhahNosrati, N.N.NosratiJahanpeima, Z.Z.JahanpeimaNavabi, Z.Z.NavabiWunderlich, H. J.H. J.WunderlichHellebrand, S.S.Hellebrand2025-08-062025-08-06202530th IEEE European Test Symposium, ETS 20259798331594503https://hdl.handle.net/11420/56514The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.enhttps://creativecommons.org/licenses/by/4.0/Computer Science, Information and General Works::006: Special computer methods::006.3: Artificial IntelligenceTechnology::621: Applied Physics::621.3: Electrical Engineering, Electronic EngineeringConference Paperhttps://doi.org/10.15480/882.1543510.1109/ETS63895.2025.11049652https://hal.science/hal-05173907v110.15480/882.15435Conference Paper