Röper, SinaSinaRöperHussak Sarah-AlexandraStachnik, KarolinaKarolinaStachnikKoziej, DorotaDorotaKoziejÅstrand, MattiasMattiasÅstrandVogt, UlrichUlrichVogtCarus, CaterinaCaterinaCarusDora, JohannesJohannesDoraHagemann, JohannesJohannesHagemannSeyrich, MartinMartinSeyrichSchroer, Christian G.Christian G.SchroerSchropp, AndreasAndreasSchropp2025-06-122025-06-122025-05-23Optics Express 33 (11): 22755-22768 (2025)https://hdl.handle.net/11420/55830Hard X-ray ptychography has strongly developed during the last decade, enabling one to visualize structural properties of materials at high spatial resolution. By combining it with multi-slicing or tomographic techniques, optically thick samples can be investigated in 3D. Nevertheless, the depth resolution in multi-slicing is often limited to several micrometers by the ptychographic optical system and a full laminographic or tomographic investigation may be hindered by experimental constraints of limited space or acquisition time. Here, we introduce a stereoscopic imaging system using two inclined nanofocused X-ray beams to illuminate a sample at varying angles at the same time. Similar to human vision, adding these stereoscopic views results in considerably improved in-depth resolution beyond the current limits of pure 2D imaging systems. This is especially promising for experimental applications requiring bulky sample environments.en1094-40872025112275522768Optica Publishing Grouphttps://creativecommons.org/licenses/by/4.0/Natural Sciences and Mathematics::539: Matter; Molecular Physics; Atomic and Nuclear physics; Radiation; Quantum PhysicsTechnology::620: Engineering::620.1: Engineering Mechanics and Materials ScienceTechnology::621: Applied Physics::621.3: Electrical Engineering, Electronic EngineeringJournal Articlehttps://doi.org/10.15480/882.1525310.1364/OE.55927310.15480/882.15253Journal Article