Wessel, S.S.WesselPagel, S.S.PagelRitter, MartinMartinRitterHohenberg, HeinrichHeinrichHohenbergWepf, R.R.Wepf2023-01-052023-01-052003Microscopy and Microanalysis 9 (SUPPL. 3): 162-163 (2003)http://hdl.handle.net/11420/14519en1435-8115Microscopy and microanalysis2003SUPPL. 3162163Topographic measurements of real structures in reflection Confocal Laser Scanning Microscope (CLSM)Conference Paper10.1017/s1431927603016246Other