Frank, MartinMartinFrankTalai, ArminArminTalaiWeigel, RobertRobertWeigelKölpin, AlexanderAlexanderKölpin2020-07-022020-07-022017-06-28Asia-Pacific Microwave Conference Proceedings, APMC: 1306-1309 (2017-06-28)http://hdl.handle.net/11420/6578This paper describes the design of two sensors for the in-line material characterization of bulk and metallized dielectrics around 10GHz and 77GHz in order to determine the relative permittivity of RF substrates. The sensors are based on a resonant grounded coplanar waveguide structure and can be applied on top of a material under test. The shift in the resonance frequency between loaded and unloaded resonator is evaluated by 3D full wave simulations to determine the relative permittivity. The basic sensor structure is improved for the inline characterization of printed circuit boards by a clearance of the resonator area and the filling of the air gaps. Measurements with different MUTs were performed with both sensors followed by the evaluation of the relative permittivity. The results are in good agreement with the expected permittivity values and show high reproducibility.enGrounded Coplanar WaveguideMaterial CharacterizationRelative PermittivityConference Paper10.1109/APMC.2017.8251702Other