Müller, JostJostMüllerBrinkmeyer, ErnstErnstBrinkmeyer2022-03-142022-03-142011ECOC 2011 Geneva : 37th European Conference and Exhibition on Optical Communication : September 18-22, 2011, Palexpo, Geneva, Switzerland. - Piscataway, NJ, 2011. - 6066111 (2011)http://hdl.handle.net/11420/11976Characterizing silicon nanophotonic waveguides with regard to local loss and distributed reflectivity, localized return loss, capture fraction, and properties of waveguide tapers is shown to be feasible. Our OFDR-based technique is reliable, fast and nondestructive. © 2011 OSA.enTechnikIngenieurwissenschaftenConference Paper10.1364/ecoc.2011.we.10.p1.41Other