Muenster, BastianBastianMuensterWelle, AlexanderAlexanderWelleRidder, BarbaraBarbaraRidderAlthuon, DanielaDanielaAlthuonStriffler, JakobJakobStrifflerFoertsch, Tobias C.Tobias C.FoertschHahn, LotharLotharHahnThelen, RichardRichardThelenStadler, VolkerVolkerStadlerNesterov-Mueller, AlexanderAlexanderNesterov-MuellerBreitling, FrankFrankBreitlingLoeffler, Felix F.Felix F.Loeffler2025-11-262025-11-262016Applied Surface Science 360: 306-3014 (2016)https://hdl.handle.net/11420/59160The coupling behavior of a microparticle embedded amino acid active-ester into a Poly(ethylene glycol)methacrylate-film, synthesized onto a silicon wafer by a grafting from approach, is characterized using dynamic time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze the 3d distribution of the amino acids in the polymer film. Besides standard solid phase peptide synthesis, employing solubilized amino acids in a solvent, we used solid polymer microparticles, incorporating the amino acids. These microparticles were especially designed for a new technique to produce high-density combinatorial peptide microarrays: upon heating, the particles become viscous, which releases the embedded amino acids to diffuse and couple to the surface. In the scope of the development of this new particle-based application, ToF-SIMS is used to analyze a complex chemically modified polymer surface layer. Due to depth profile measurements, it is possible to investigate the particle-based coupling reaction not only on the surface, but also into the depth of the PEGMA film.enApplied Surface Science2016306314C 60 depth profilingCombinatorial laser fusingFunctionalized PEGMA coated surfacesHigh-density peptide arraysParticle-based solid phase peptide synthesisSecondary ion mass spectrometryTechnology::600: TechnologySolid-material-based coupling efficiency analyzed with time-of-flight secondary ion mass spectrometryJournal Article10.1016/j.apsusc.2015.10.223Journal Article