Rehanek, JensJensRehanekBraig, ChristophChristophBraigLöchel, HeikeHeikeLöchelMarschall, FelixFelixMarschallBeye, MartinMartinBeyeRaiser, DirkDirkRaiserThekku Veedu, SreevidyaSreevidyaThekku VeeduRösner, BenediktBenediktRösnerDöring, FlorianFlorianDöringBuck, JensJensBuckRothkirch, AndréAndréRothkirchViefhaus, JensJensViefhausDavid, ChristianChristianDavidTechert, SimoneSimoneTechertYin, ZhongZhongYin2026-08-312026-08-312026-08-05Optics Express 34 (16): 30262-30271 (2026)https://hdl.handle.net/11420/64538We demonstrate two-dimensional (2-D) imaging and resonant inelastic X-ray scattering (RIXS) spectroscopy in the hν2 “mapping” scheme using a reflection zone plate (RZP) at soft X-rays. Experiments at the PETRA III storage ring (DESY) around the N Kα line (392.4 eV) verify that an RZP can be used in the paraxial regime combined with the 1-D line scanning mode for time-efficient full-field imaging of an extended object with an angular size of 2.5 mrad at low aberrations, even for off-design energies, at a spatial resolution of (14–24) μm. A similar setup collects the RIXS spectra of acetonitrile within (388.6–401.8) eV for a variable incident photon energy between 399 eV and 400 eV, at a potential resolution of (0.3 ± 0.1) eV. RZPs with their precise manufacturability, efficiency, and strong dispersion can serve as advantageous diffractive optical elements in soft X-ray microscopy or “photon-in vs. photon-out” spectroscopy.en1094-40872026163026230271Optica Publishing Grouphttps://creativecommons.org/licenses/by/4.0/Natural Sciences and Mathematics::530: PhysicsTechnology::621: Applied PhysicsJournal Article10.1364/OE.59682610.15480/882.18105