Examination of the stress concentration factor of single and multiple ellipsoidal defects by means of finite element method

Younes, AbdullahAbdullahYounes2021-05-252021-05-252021-02-25Technische Universität Hamburg (2021)http://hdl.handle.net/11420/9596enhttp://rightsstatements.org/vocab/InC/1.0/TechnikIngenieurwissenschaftenExamination of the stress concentration factor of single and multiple ellipsoidal defects by means of finite element methodUntersuchung von Spannungskonzentrationsfaktors einzelner und mehrfacher ellipsoider Defekte mit Hilfe der Finite-Elemente-MethodeThesis10.15480/882.355510.15480/882.3555Ehlers, SörenSörenEhlersBraun, MoritzMoritzBraunStudy Thesis