Prasciolu, MauroMauroPrascioluMurray, Kevin T.Kevin T.MurrayIvanov, NikolayNikolayIvanovFleckenstein, HolgerHolgerFleckensteinDomaracky, MartinMartinDomarackyGelisio, LucaLucaGelisioTrost, FabianFabianTrostAyyer, KartikKartikAyyerKrebs, DietrichDietrichKrebsAplin, StevenStevenAplinAwel, SalahSalahAwelBösenberg, UlrikeUlrikeBösenbergBelšak, GregaGregaBelšakBarty, AntonAntonBartyEstillore, Armando D.Armando D.EstilloreFuchs, MatthiasMatthiasFuchsGevorkov, YaroslavYaroslavGevorkovHallmann, JörgJörgHallmannKim, ChanChanKimKnoška, JurajJurajKnoškaKüpper, JochenJochenKüpperLi, ChufengChufengLiLu, WeiWeiLuMariani, ValerioValerioMarianiMorgan, Andrew J.Andrew J.MorganMöller, JohannesJohannesMöllerMadsen, AndersAndersMadsenOberthür, DominikDominikOberthürPeña Murillo, Gisel E.Gisel E.Peña MurilloReis, David A.David A.ReisScholz, MarkusMarkusScholzŠarler, BozidarBozidarŠarlerVillanueva-Perez, PabloPabloVillanueva-PerezYefanov, OleksandrOleksandrYefanovZielinski, Kara A.Kara A.ZielinskiZozulya, AlexeyAlexeyZozulyaChapman, Henry N.Henry N.ChapmanBajt, SašaSašaBajt2024-07-042024-07-042021International Conference on X-Ray Lasers 2020 : 8-10 December 2020, online only. - (Proceedings of SPIE ; vol. 11886). - 118860M (2021)978-1-5106-4618-6978-1-5106-4619-3https://hdl.handle.net/11420/48206We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.enMultilayer Laue lensesOpticsXFELX-raysTechnology::621: Applied Physics::621.3: Electrical Engineering, Electronic EngineeringConference Paper10.1117/12.2592229Conference Paper