Müller, JostJostMüllerKrause, MichaelMichaelKrauseBrinkmeyer, ErnstErnstBrinkmeyer2023-10-242023-10-242011-05-26Electronics Lettershttps://hdl.handle.net/11420/43818Spatially resolved determination of loss in silicon nanophotonic waveguides using optical frequency-domain reflectometry is reported. Taking measurements from either side of a waveguide, discriminating loss from non-uniform scattering properties is demonstrated. This technique is fast, nondestructive and does not require any knowledge about the launching efficiency. © 2011 The Institution of Engineering and Technology.en0013-5194201111668670IETEngineering and Applied OperationsJournal Article10.1049/el.2011.0939Journal Article