Solan, EnverEnverSolanDirkmann, SvenSvenDirkmannHansen, MirkoMirkoHansenSchröder, DietmarDietmarSchröderKohlstedt, HermannHermannKohlstedtZiegler, MartinMartinZieglerMussenbrock, ThomasThomasMussenbrockOchs, KarlheinzKarlheinzOchs2019-12-022019-12-022017-04-13Journal of Physics D: Applied Physics 19 (50): 195102 (2017-04-13)http://hdl.handle.net/11420/3921The massive parallel approach of neuromorphic circuits leads to effective methods for solving complex problems. It has turned out that resistive switching devices with a continuous resistance range are potential candidates for such applications. These devices are memristive systems - nonlinear resistors with memory. They are fabricated in nanotechnology and hence parameter spread during fabrication may aggravate reproducible analyses. This issue makes simulation models of memristive devices worthwhile. Kinetic Monte-Carlo simulations based on a distributed model of the device can be used to understand the underlying physical and chemical phenomena. However, such simulations are very time-consuming and neither convenient for investigations of whole circuits nor for real-time applications, e.g. emulation purposes. Instead, a concentrated model of the device can be used for both fast simulations and real-time applications, respectively. We introduce an enhanced electrical model of a valence change mechanism (VCM) based double barrier memristive device (DBMD) with a continuous resistance range. This device consists of an ultra-thin memristive layer sandwiched between a tunnel barrier and a Schottky-contact. The introduced model leads to very fast simulations by using usual circuit simulation tools while maintaining physically meaningful parameters. Kinetic Monte-Carlo simulations based on a distributed model and experimental data have been utilized as references to verify the concentrated model.en1361-6463201719IOP Publ.https://creativecommons.org/licenses/by/3.0/electrical modelingmemristive devicesmemristornanoelectronicsneuromorphic circuitsresistive switchingTechnikJournal Article10.15480/882.252210.1088/1361-6463/aa69ae10.15480/882.2522Journal Article