Chapman, Henry N.Henry N.ChapmanBajt, SašaSašaBajtAwel, SalahSalahAwelTrieu, Hoc KhiemHoc KhiemTrieuBohne, SvenSvenBohneEbrahimifard, RezaRezaEbrahimifard2024-03-122024-03-122022-11-09EP4086615 (2022)https://hdl.handle.net/11420/46385The invention relates to a method and a system (1) for examining sample particles (2) by X-ray radiation. The method comprises the following steps: a) Generating a flow of a sample fluid (4) along a fluid path (6) in a transport direction Y, wherein sample particles (2) are distributed in the sample fluid (4); b) Exposing the sample fluid (4) flowing through a first application section (8) of the fluid path (6) to a first laser light generated by a first laser light source (38) for a first holding time period such that a first optical light pressure is applied on sample particles (2) entering the first application section (8) resulting in a bunch (12) of sample particles (2), which is released at the end of the first holding time period; c) Repeating step b) such that the fluid flow of the sample fluid (4) leaving the first application section (8) carries a first sequence (14) of spaced bunches (12) of sample particles (2); d) Exposing the sample fluid (4) flowing through a detection section (16) of the fluid path (6) downstream to the first application section (8) to an X-ray set of at least one X-ray pulse generated by an X-ray source (18); e) Repeating step d) to form a second sequence of spaced X-ray sets such that each of the spaced X-ray sets partly or fully intersects a different bunch (12) of the bunches (12) of sample particles (2) carried by the sample fluid (4) flowing through the detection section (16); and f) Detecting by means of an X-ray detector (22) an X-ray radiation formed by the X-ray pulses of the second sequence of spaced X-ray set modified by the bunches (12,32) of sample particles (2) in step e).enPatentOther