Krautschneider, WolfgangWolfgangKrautschneiderMeyberg, W.W.Meyberg2024-06-192024-06-191987In: Giovanni Soncini, Pier Ugo Calzolari (Hrsg.): Solid state devices : proceedings of the 17th European Solid State Device Research Conference, ESSDERC '87, Bologna, Italy, 14-17 September 1987. - Amsterdam ; New York ; New York, N.Y., U.S.A : North-Holland ; Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co, 1988. - S. 709-71204447047799780444704771https://hdl.handle.net/11420/47912A method has been developed for estimation of soft error rate of memory chips. At special test structures which are as simply designed as possibly the charge collection induced by alpha strikes is measured. From these data the soft error rate can be calculated.enTechnology::621: Applied Physics::621.3: Electrical Engineering, Electronic EngineeringConference Paperhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5436731Conference Paper