Krautschneider, WolfgangWolfgangKrautschneiderMeyberg, W.W.Meyberg2024-06-192024-06-19198717th European Solid State Device Research Conference, ESSDERC 1987https://hdl.handle.net/11420/47912A method has been developed for estimation of soft error rate of memory chips. At special test structures which are as simply designed as possibly the charge collection induced by alpha strikes is measured. From these data the soft error rate can be calculated.enTechnology::621: Applied Physics::621.3: Electrical Engineering, Electronic EngineeringConference Paperhttps://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5436731