Ritter, MartinMartinRitterKranzmann, AxelAxelKranzmannHemmleb, MatthiasMatthiasHemmleb2023-01-052023-01-052008-0914th European Microscopy Congress (EMC 2008)http://hdl.handle.net/11420/14512enAnalysis of multimodal 3D microscopy measurementsJournal Article10.1007/978-3-540-85228-5_188Other