Impact of free-carrier electric-field screening on the transmissivity of long low-loss p-i-n silicon waveguides

Renner, HagenHagenRenner2020-04-272020-04-272013Integrated photonics research, silicon and nanophotonics : part of Advanced photonics ; 14 - 17 July 2013, Rio Grande, Puerto Rico, United States ... / OSA, The Optical Society. - Washington DC : OSA, 2013.http://hdl.handle.net/11420/5904We show analytically for long low-loss p-i-n silicon waveguides that upshifting the electric-fieldscreening threshold intensity simultaneously requires an adequate reduction of the low-intensity free-carrier lifetime to improve the high-intensity transmissivity. © 2011 OSA.enTechnikIngenieurwissenschaftenImpact of free-carrier electric-field screening on the transmissivity of long low-loss p-i-n silicon waveguidesConference PaperOther