Project Title
SFB 986: Subproject B09 - Microstructure-based classification and electronmicroscopy analysis of nanoporous metals by machine learning
Funding Code
192346071
Principal Investigator
Status
Laufend
Duration
01-07-2020
-
30-06-2024
GEPRIS-ID
Funding Organization
Parent project
Project Abstract
Focused ion beam (FIB) tomography determines the three-dimensional microstructure of materials via a series of two-dimensional scanning electron microscope (SEM) images. In nanoporous metals, FIB tomography is often facing problems with so-called shine-through effects, which can significantly reduce the accuracy with which FIB tomography data can be segmented. This project will use machine learning to develop a new segmentation method which can efficiently suppress shine-through effects and thus enable a reconstruction even of complex hierarchical multi-scale microstructures of nanoporous metals with excellent accuracy.