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Equipment
Rasterkraftmikroskop JPK Instruments NanoWizard AFM
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Equipment description
Name
Rasterkraftmikroskop JPK Instruments NanoWizard AFM
Manufacturer
JPK Instruments AG
DOI
10.15480/882.13901
Internal ID
36502007731-00
Classification
5091 -- Raster-Tunnel-, Rasterkraft-Mikroskope
Access
Owner Organisation
Material- und Röntgenphysik M-2
Contact Person
Huber, Patrick
Available since
February 18, 2018
