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Equipment
Rasterelektronenmikroskop - FEI Helios Nanolab G3 UC
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Equipment description
Name
Rasterelektronenmikroskop - FEI Helios Nanolab G3 UC
Manufacturer
Fei Deutschland GmbH
DOI
10.15480/882.13955
Internal ID
36502005550-00
Classification
5120 -- Rasterelektronenmikroskope (REM)
Access
Owner Organisation
Betriebseinheit Elektronenmikroskopie BEEM
Contact Person
Ritter, Martin
Available since
March 23, 2016
