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Manufacturing reliability of LTCC millimeter-wave passive components
Publikationstyp
Journal Article
Publikationsdatum
2008-10-24
Sprache
English
Author
Institut
Volume
56
Issue
11
Start Page
2574
End Page
2581
Article Number
4657400
Citation
IEEE Transactions on Microwave Theory and Techniques 56 (11): 4657400 2574-2581 (2008-11-01)
Publisher DOI
Scopus ID
Publisher
IEEE
The manufacturing reliability of low-temperature co-fired ceramic circuits up to millimeter-wave frequencies and the associated tolerances are studied. The printing accuracy and software tools are initially verified. In the main part of this study, representative circuit elements are analyzed, i.e., a planar band-pass filter, buried filter, and vertical low-pass network, which take advantage of fine line printing and high-permittivity inclusions. The passive structures are investigated for deviations in the magnitude and phase of their scattering parameters, also analyzing temperature effects. A dispersion characteristic is introduced to the simulations in order to achieve the best match with measurements. All samples show very little manufacturing variations up to 67 GHz and a high reproducibility from run to run. © 2008 IEEE.
Schlagworte
Low-temperature co-fired ceramic (LTCC)
Manufacturing
Millimeter-wave circuits
Reliability
Tolerance analysis
DDC Class
600: Technik
620: Ingenieurwissenschaften