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  4. Extensions to the contour integral method for efficient modeling of TM scattering in two-dimensional photonic crystals
 
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Extensions to the contour integral method for efficient modeling of TM scattering in two-dimensional photonic crystals

Publikationstyp
Conference Paper
Date Issued
2013
Sprache
English
Author(s)
Preibisch, Jan  
Duan, Xiaomin  
Schuster, Christian  
Institut
Theoretische Elektrotechnik E-18  
TORE-URI
http://hdl.handle.net/11420/7498
Start Page
493
End Page
495
Article Number
6809097
Citation
2013 7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS) : 16 - 21 Sept. 2013, Bordeaux, France / IEEE. - Piscataway, NJ : IEEE, 2013. - Art.-Nr. 6809097 i.e. Seite 493-495
Contribution to Conference
7th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics 2013, METAMATERIALS 2013  
Publisher DOI
10.1109/MetaMaterials.2013.6809097
Scopus ID
2-s2.0-84901218132
Publisher
IEEE
We present an extension to the contour integral method (CIM) for the treatment of two-dimensional scattering problems from circular inclusions with plane wave excitation. CIM is an integral equation approach to planar problems whose efficiency can be greatly enhanced by semi-analytical treatment of circular scatterers. It is related to the boundary element method (BEM) and shows promising domain decomposition capabilities. The performance and accuracy is compared to the full-wave finite integral technique (FIT) by studying the scattering of an array of dielectric rods.
DDC Class
530: Physik
600: Technik
620: Ingenieurwissenschaften
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