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In-Situ-Linearization for Instantaneous Frequency Measurement Systems
Publikationstyp
Conference Paper
Date Issued
2019
Sprache
English
TORE-URI
Start Page
539
End Page
542
Article Number
8910810
Citation
European Microwave Conference, EuMC : 8910810 (2019)
Contribution to Conference
Publisher DOI
Scopus ID
In this publication a linearization process for six-port based instantaneous frequency measurement (IFM) systems for surface acoustic wave (SAW) resonators is presented. This concept makes the system more tolerant against temperature and other environmental influences and can be further implemented on microcontrollers. Measurements in the temperature chamber are presented to show the feasibility of the developed demonstrator and algorithms.