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  4. In-Situ-Linearization for Instantaneous Frequency Measurement Systems
 
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In-Situ-Linearization for Instantaneous Frequency Measurement Systems

Publikationstyp
Conference Paper
Date Issued
2019
Sprache
English
Author(s)
Scheiner, Benedict  
Lurz, Fabian  
Michler, Fabian  
Weigel, Robert  
Kölpin, Alexander  orcid-logo
TORE-URI
http://hdl.handle.net/11420/6436
Start Page
539
End Page
542
Article Number
8910810
Citation
European Microwave Conference, EuMC : 8910810 (2019)
Contribution to Conference
49th European Microwave Conference, EuMC 2019  
Publisher DOI
10.23919/EuMC.2019.8910810
Scopus ID
2-s2.0-85076369953
In this publication a linearization process for six-port based instantaneous frequency measurement (IFM) systems for surface acoustic wave (SAW) resonators is presented. This concept makes the system more tolerant against temperature and other environmental influences and can be further implemented on microcontrollers. Measurements in the temperature chamber are presented to show the feasibility of the developed demonstrator and algorithms.
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