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European Test Symposium Teams: an anniversary snapshot
Citation Link: https://doi.org/10.15480/882.15435
Publikationstyp
Conference Paper
Date Issued
2025
Sprache
English
Author(s)
Jenihhin, M.
Raik, J.
Jutman, A.
Cherezova, N.
Ubar, R.
Miclea, L.
Enyedi, S.
Stefan, I.
Corches, C.
Peng, Z.
Eles, P.
Drechsler, R.
Eggersglus, S.
Glowatz, A.
Tille, D.
Gielen, G.
Coyette, A.
Dobbelaere, W.
Vanhooren, R.
Chuang, P. Y.
Marinissen, E. J.
Di Natale, G.
Barragan, M.
Maistri, P.
Vatajelu, E. I.
Bernardi, P.
Di Carlo, S.
Prinetto, P.
Sonza Reorda, M.
Violante, M.
Stratigopoulos, H. G.
Neophytou, S.
Hadjitheophanous, S.
Christou, K.
Skitsas, M.
Bosio, A.
Deveautour, B.
Girard, P.
Traiola, M.
Virazel, A.
Fernandes Dos Santos, F.
Kritikakou, A.
Casagranda, G.
Vallero, M.
Vella, F.
Rech, P.
Bolzani Poehls, L. M.
Krstic, M.
Andjelkovic, M.
Tshagharyan, G.
Harutyunyan, G.
Vardanian, V.
Shoukourian, S.
Zorian, Y.
Dworak, J.
Nepal, K.
Manikas, T.
Taouil, M.
Fieback, M.
Gebregiorgis, A.
Bishnoi, R.
Hamdioui, S.
Chatterjee, A.
Saha, A.
Komarraju, S.
Amarnath, C.
Tahoori, M.
Mayahinia, M.
Rajabalipanah, M.
Basharkhah, K.
Nosrati, N.
Jahanpeima, Z.
Navabi, Z.
Wunderlich, H. J.
Hellebrand, S.
TORE-DOI
Citation
30th IEEE European Test Symposium, ETS 2025
Contribution to Conference
Publisher DOI
Publisher Link
Scopus ID
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISBN
9798331594503
The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team's section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.
DDC Class
006.3: Artificial Intelligence
621.3: Electrical Engineering, Electronic Engineering
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European_Test_Symposium_Teams_an_Anniversary_Snapshot.pdf
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