TUHH Open Research
Help
  • Log In
    New user? Click here to register.Have you forgotten your password?
  • English
  • Deutsch
  • Communities & Collections
  • Publications
  • Research Data
  • People
  • Institutions
  • Projects
  • Statistics
  1. Home
  2. TUHH
  3. Publication References
  4. Adaptive On-the-fly Scan Method for Fast and Efficient Planar Near-field Acquisition
 
Options

Adaptive On-the-fly Scan Method for Fast and Efficient Planar Near-field Acquisition

Publikationstyp
Journal Article
Date Issued
2025-04-02
Sprache
English
Author(s)
Yang, Cheng  
Theoretische Elektrotechnik E-18  
Monopoli, Tomas  
Götschel, Sebastian  orcid-logo
Mathematik E-10  
Wu, Xinglong  
Grassi, Flavia  
Schuster, Christian  
Theoretische Elektrotechnik E-18  
TORE-URI
https://hdl.handle.net/11420/55439
Journal
IEEE antennas and wireless propagation letters  
Citation
IEEE Antennas and Wireless Propagation Letters (in Press): (2025)
Publisher DOI
10.1109/LAWP.2025.3557192
Scopus ID
2-s2.0-105001998488
Publisher
Institute of Electrical and Electronics Engineers Inc.
Recent advancements in adaptive planar near-field scanning have enhanced the use of sparse measurement data for electromagnetic field (EMF) modeling and prediction. In this work, we propose an adaptive planar scanning solution that utilizes iterative row-by-row scans, where each row is scanned on-the-fly (OTF). Both the total number of rows and their separation are dynamically adjusted and optimized through correlation analysis of the values obtained from previous measurements. For initialization, a few evenly distributed row scans, typically 4-6 OTF scans, are performed, followed by an iterative process of finding new rows to scan using Gaussian Process Regression (GPR) based Bayesian optimization. For validation, both numerical and experimental examples, including wire and patch antenna arrays, are provided. Results show good performance of the proposed method, enabling rapid near-field acquisition within minutes, making it suitable for large-scale and high-resolution EMF scanning applications.
Subjects
adaptive sampling | Bayesian optimization | Gaussian Process | Near-field measurement | on-the-fly scan
DDC Class
621.3: Electrical Engineering, Electronic Engineering
TUHH
Weiterführende Links
  • Contact
  • Send Feedback
  • Cookie settings
  • Privacy policy
  • Impress
DSpace Software

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science
Design by effective webwork GmbH

  • Deutsche NationalbibliothekDeutsche Nationalbibliothek
  • ORCiD Member OrganizationORCiD Member Organization
  • DataCiteDataCite
  • Re3DataRe3Data
  • OpenDOAROpenDOAR
  • OpenAireOpenAire
  • BASE Bielefeld Academic Search EngineBASE Bielefeld Academic Search Engine
Feedback