Stereo hard X-ray ptychography

Hard X-ray ptychography has strongly developed during the last decade, enabling one to visualize structural properties of materials at high spatial resolution. By combining it with multi-slicing or tomographic techniques, optically thick samples can be investigated in 3D. Nevertheless, the depth resolution in multi-slicing is often limited to several micrometers by the ptychographic optical system and a full laminographic or tomographic investigation may be hindered by experimental constraints of limited space or acquisition time. Here, we introduce a stereoscopic imaging system using two inclined nanofocused X-ray beams to illuminate a sample at varying angles at the same time. Similar to human vision, adding these stereoscopic views results in considerably improved in-depth resolution beyond the current limits of pure 2D imaging systems. This is especially promising for experimental applications requiring bulky sample environments.

DDC Class

539: Matter; Molecular Physics; Atomic and Nuclear physics; Radiation; Quantum Physics

620.1: Engineering Mechanics and Materials Science

621.3: Electrical Engineering, Electronic Engineering

Funding(s)

DASHH Helmholtz Graduiertenkolleg

Publication version

publishedVersion

Lizenz

https://creativecommons.org/licenses/by/4.0/

Name

oe-33-11-22755.pdf

Type

Main Article

Size

11.17 MB

Format

Adobe PDF

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Stereo hard X-ray ptychography