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  4. Validation and application of physics-based via models to dense via arrays
 
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Validation and application of physics-based via models to dense via arrays

Publikationstyp
Conference Paper
Date Issued
2011
Sprache
English
Author(s)
Gu, Xiaoxiong  
Kwark, Young Hoon  
Zhang, Yao Jiang  
Fan, Jun  
Ruehli, Albert  
Kotzev, Miroslav A.  
Müller, Sebastian  
Rimolo-Donadio, Renato  
Schuster, Christian  
Archambeault, Bruce  
Institut
Theoretische Elektrotechnik E-18  
TORE-URI
http://hdl.handle.net/11420/12102
Volume
2
Start Page
1031
End Page
1051
Citation
DesignCon 2011 ; Vol. 2 (): 1031-1051 (2011)
Contribution to Conference
DesignCon 2011  
Scopus ID
2-s2.0-84866382276
Publisher
Curran
Fast and accurate via models are required to analyze dense via arrays on printed circuit boards with pitches up to 1mm. Fundamentals of physics-based via models are reviewed and their advantages over general-purpose electromagnetic field solvers are discussed. Recent studies extend the models to take into account multiple scattering among vias. This paper also analyzes if anisotropic field distribution on via holes, and boundary reflection due to the finite size of power planes play a role for high speed digital designs. The updated via models are validated by hardware measurement and 3D full-wave simulations.
DDC Class
530: Physik
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