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Fast in-situ diode detector characterization for Six-Port interferometer receivers
Publikationstyp
Conference Paper
Date Issued
2014-01
Sprache
English
TORE-URI
Start Page
13
End Page
15
Article Number
6825501
Citation
IEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet: 6825501 (2014-01)
Contribution to Conference
Publisher DOI
Six-Port receivers require a precise power measurement of all their four output channels. However, due to temperature drift, fabrication and component tolerances detectors' performance may have some degradation, which limits the measurement accuracy. Thus, an in-situ detector characterization is necessary. In this paper, a fast and simple solution for estimating the diode detector's characteristics is presented, which is ideal for Six-Port diode power detectors. This method is fast and can be easily implemented on a microcontroller. © 2014 IEEE.
Subjects
characterization
diode detector
in-situ
power measure-ment
Six-Port