Single-event effect responses of integrated panar inductors in 65 nm CMOS

This article describes a previously unreported single-event radiation effect in spiral inductors manufactured in a commercial CMOS technology when subjected to ionizing radiation. Inductors play a major role as the component determining the frequency of LC tank oscillators, which is why any radiation effects in these passive components can have detrimental impact on the performance of clock generation circuits. Different experiments performed to localize and characterize the Single-Event Effect (SEE) response in a radiation-hardened PLL circuit are discussed and presented together with an hypothesis for the underlying physical mechanism.

Subjects

Inductors

Ions

Metal-Insulator Structures

Metals

Oscillators

Phase locked loops

Phase-Locked Loops

Radiation effects

Radiation Effects

Sensitivity

Silicon

SiO2

DDC Class

600: Technik

Publication version

publishedVersion

Lizenz

https://creativecommons.org/licenses/by/4.0/

Name

Single-Event_Effect_Responses_of_Integrated_Planar_Inductors_in_65-nm_CMOS.pdf

Size

10.44 MB

Format

Adobe PDF

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Single-event effect responses of integrated panar inductors in 65 nm CMOS