Adaptive microsystems with optical line sensors for measurement and quality control

Publikationstyp
Conference Paper
Date Issued
1995
Sprache
English
Author(s)
Martiny, Ingo  
Grigat, Rolf-Rainer  
Institut
Bildverarbeitungssysteme E-2  
TORE-URI
http://hdl.handle.net/11420/10321
Citation
SPIE's 1995 International Symposium on Optical Science, Engineering and Instrumentation, San Diego, California, 9.-14. Juli 1995
Contribution to Conference
SPIE's 1995 International Symposium on Optical Science, Engineering and Instrumentation  
DDC Class
530: Physik
600: Technik
620: Ingenieurwissenschaften