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Adaptive microsystems with optical line sensors for measurement and quality control
Publikationstyp
Conference Paper
Publikationsdatum
1995
Sprache
English
Institut
Citation
SPIE's 1995 International Symposium on Optical Science, Engineering and Instrumentation, San Diego, California, 9.-14. Juli 1995
Contribution to Conference
DDC Class
530: Physik
600: Technik
620: Ingenieurwissenschaften