In-line material characterization sensors operating at 10GHz and 77GHz

Publikationstyp
Conference Paper
Date Issued
2017-06-28
Sprache
English
Author(s)
Frank, Martin  
Talai, Armin  
Weigel, Robert  
Kölpin, Alexander  orcid-logo
TORE-URI
http://hdl.handle.net/11420/6578
Start Page
1306
End Page
1309
Citation
Asia-Pacific Microwave Conference Proceedings, APMC: 1306-1309 (2017-06-28)
Contribution to Conference
Asia-Pacific Microwave Conference Proceedings, APMC 2017  
Publisher DOI
10.1109/APMC.2017.8251702
This paper describes the design of two sensors for the in-line material characterization of bulk and metallized dielectrics around 10GHz and 77GHz in order to determine the relative permittivity of RF substrates. The sensors are based on a resonant grounded coplanar waveguide structure and can be applied on top of a material under test. The shift in the resonance frequency between loaded and unloaded resonator is evaluated by 3D full wave simulations to determine the relative permittivity. The basic sensor structure is improved for the inline characterization of printed circuit boards by a clearance of the resonator area and the filling of the air gaps. Measurements with different MUTs were performed with both sensors followed by the evaluation of the relative permittivity. The results are in good agreement with the expected permittivity values and show high reproducibility.
Subjects
Grounded Coplanar Waveguide
Material Characterization
Relative Permittivity