Options
Studying the degradation of propagation delay on FPGAs at the European XFEL
Publikationstyp
Conference Paper
Date Issued
2024-08
Sprache
English
Start Page
65
End Page
72
Citation
Proceedings - 27th Euromicro Conference on Digital System Design, DSD 2024: 65-72
Contribution to Conference
Publisher DOI
Scopus ID
Publisher
IEEE
ISBN
979-8-3503-8038-5
979-8-3503-8039-2
An increasing number of unhardened commercial-off-the-shelf embedded devices are deployed under harsh operating conditions and in highly-dependable systems. Due to the mechanisms of hardware degradation that affect these devices, ageing detection and monitoring are crucial to prevent critical failures. In this paper, we empirically study the propagation delay of 298 naturally-aged FPGA devices that are deployed in the European XFEL particle accelerator. Based on in-field measurements, we find that operational devices show significantly slower switching frequencies than unused chips, and that increased gamma and neutron radiation doses correlate with increased hardware degradation. Furthermore, we demonstrate the feasibility of developing machine learning models that estimate the switching frequencies of the devices based on historical and environmental data.
Subjects
Embedded hardware | FPGA | hardware degradation
DDC Class
600: Technology