Extension of the contour integral method for the modeling of TE scattering in two-dimensional photonic structures using the duality principle

Publikationstyp
Conference Paper
Date Issued
2016-11-16
Sprache
English
Author(s)
Preibisch, Jan  
Schuster, Christian  
Institut
Theoretische Elektrotechnik E-18  
TORE-URI
http://hdl.handle.net/11420/5246
Start Page
292
End Page
294
Article Number
7746520
Citation
10th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2016: 7746520, 292-294 (2016-11-16)
Contribution to Conference
10th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2016;  
Publisher DOI
10.1109/MetaMaterials.2016.7746520
Scopus ID
2-s2.0-85006073399
Publisher
IEEE
The Contour Integral Method (CIM) is a numerically efficient modeling technique for planar or infinitely extended two-dimensional (2-D) structures. In the optical regime, the CIM has already been adapted and applied for the modeling of TM0z-mode scattering in photonic crystals. In this work the dual case of TE0z-mode scattering is addressed. Making use of the duality principle, expressions for the behavior of the TE0z-mode can be derived from the system matrices associated with the TE0z-mode. This allows to reuse use formulas and program code written for the TE0z-mode with minimal adjustments. The results are validated by comparison to full-wave simulations.
DDC Class
600: Technik