Characterizing silicon waveguides : local attenuation and distributed reflectivity

Publikationstyp
Conference Paper
Date Issued
2011
Sprache
English
Author(s)
Müller, Jost  
Brinkmeyer, Ernst  
Institut
Optische Kommunikationstechnik E-11(H)  
TORE-URI
http://hdl.handle.net/11420/11976
Article Number
6066111
Citation
ECOC 2011 Geneva : 37th European Conference and Exhibition on Optical Communication : September 18-22, 2011, Palexpo, Geneva, Switzerland. - Piscataway, NJ, 2011. - 6066111 (2011)
Contribution to Conference
37th European Conference and Exhibition on Optical Communication, ECOC 2011  
Publisher DOI
10.1364/ecoc.2011.we.10.p1.41
Scopus ID
2-s2.0-82155201770
Publisher
IEEE
ISBN of container
978-1-557-52931-2
Characterizing silicon nanophotonic waveguides with regard to local loss and distributed reflectivity, localized return loss, capture fraction, and properties of waveguide tapers is shown to be feasible. Our OFDR-based technique is reliable, fast and nondestructive. © 2011 OSA.
DDC Class
600: Technik
620: Ingenieurwissenschaften