Characterizing silicon waveguides : local attenuation and distributed reflectivity

Publikationstyp
Conference Paper
Date Issued
2011
Sprache
English
Author(s)
Müller, Jost  
Brinkmeyer, Ernst  
Institut
Optische Kommunikationstechnik E-11(H)  
TORE-URI
http://hdl.handle.net/11420/11976
Article Number
6066111
Citation
ECOC 2011 Geneva : 37th European Conference and Exhibition on Optical Communication : September 18-22, 2011, Palexpo, Geneva, Switzerland. - Piscataway, NJ, 2011. - 6066111 (2011)
Contribution to Conference
37th European Conference and Exhibition on Optical Communication, ECOC 2011  
Publisher DOI
10.1364/ecoc.2011.we.10.p1.41
Scopus ID
2-s2.0-82155201770
Publisher
IEEE
Characterizing silicon nanophotonic waveguides with regard to local loss and distributed reflectivity, localized return loss, capture fraction, and properties of waveguide tapers is shown to be feasible. Our OFDR-based technique is reliable, fast and nondestructive. © 2011 OSA.
DDC Class
600: Technik
620: Ingenieurwissenschaften