Evaluation of serial crystallographic structure determination within megahertz pulse trains
Citation Link: https://doi.org/10.15480/882.3691
Publikationstyp
Journal Article
Date Issued
2019-12-04
Sprache
English
Author(s)
Institut
TORE-DOI
TORE-URI
Journal
Volume
6
Issue
6
Start Page
064702
Citation
Structural Dynamics 6 (6): 064702 (2019)
Publisher DOI
Scopus ID
Publisher
American Institute of Physics (AIP)
The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whether the use of a pulse repetition rate nearly four orders of magnitude higher than previously possible results in unwanted structural changes due to either radiation damage or systematic effects on data quality. Here, separate structures from the first and subsequent pulses in the European XFEL pulse train were determined, showing that there is essentially no difference between structures determined from different pulses under currently available operating conditions at the European XFEL.
DDC Class
004: Informatik
Publication version
publishedVersion