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Gate insulators and interface effects in organic thin-film transistors
Publikationstyp
Journal Article
Publikationsdatum
2008-02
Sprache
English
Enthalten in
Volume
9
Issue
1
Start Page
70
End Page
76
Citation
Organic Electronics 9 (1): 70-76 (2008-02)
Publisher DOI
Scopus ID
Publisher
Elsevier Science
This paper presents a detailed characterization of different thermosetting polymers to be used as gate dielectrics in organic thin-film transistors. Selected materials yield smooth films with good insulation properties and offer attractive processing conditions. Bottom-gate transistors were prepared using these dielectrics and compared to hybrid transistors with surface-treated SiO2 as the dielectric. Gate bias induced leakage and solvent effects were investigated by preparing metal/insulator/semiconductor devices. Poly(3-hexylthiophene) (P3HT) transistors with organic dielectrics exhibited higher channel conductivity and lower mobility values with respect to P3HT-hybrid transistors and pentacene transistors. The importance of dielectric/semiconductor interface was discussed by comparing the performances of pentacene and P3HT transistors produced on different dielectrics.
Schlagworte
Interface
Organic thin-film transistor
P3HT
Polymer dielectric
Solvents
DDC Class
621.3: Electrical Engineering, Electronic Engineering