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X-ray characterization of a TiAlN-coating on a mixed ceramic substrate with a resolution of a few microns
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X-ray characterization of a TiAlN-coating on a mixed ceramic substrate with a resolution of a few microns
Basic Data Publication
Publikationstyp
Journal Article
Date Issued
2010
Sprache
English
Author(s)
Eichenseer, Christiane
Produktionsmanagement und -technik M-18
Hintze, Wolfgang
Produktionsmanagement und -technik M-18
Schneider, Gerold A.
Keramische Hochleistungswerkstoffe M-9
Röhlsberger, R.
Glaser, L.
Schell, Norbert
TORE-URI
https://hdl.handle.net/11420/56410
Publisher Version
Journal
Photon science
Citation
Photon science HASYLAB Annual Reports: (2010)
Publisher
HASYLAB
Content
DDC Class
600: Technology
