On the use of multilayer Laue lenses with X-ray free electron lasers

First published in
Proceedings of SPIE  
Number in series
11886
Volume
11886
Article Number
118860M
Citation
International Conference on X-Ray Lasers 2020 : 8-10 December 2020, online only. - (Proceedings of SPIE ; vol. 11886). - 118860M (2021)
Contribution to Conference
XVII International Conference on X-Ray Lasers 2020  
Publisher DOI
10.1117/12.2592229
Scopus ID
2-s2.0-85121599205
Publisher
SPIE
ISBN
978-1-5106-4618-6
978-1-5106-4619-3
We report on the use of multilayer Laue lenses to focus the intense X-ray Free Electron Laser (XFEL) beam at the European XFEL to a spot size of a few tens of nanometers. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique X-ray source.
Subjects
Multilayer Laue lenses
Optics
XFEL
X-rays
DDC Class
621.3: Electrical Engineering, Electronic Engineering