Options
Data-Driven Test Generation for Black-Box Systems from Learned Decision Tree Models
Publikationstyp
Conference Paper
Date Issued
2023-05
Sprache
English
Citation
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023)
Contribution to Conference
Publisher DOI
Scopus ID
ISBN of container
9798350332773
Testing of black-box systems is a difficult task, because no prior knowledge on the system is given that can be used for design and evaluation of tests. Learning a model of a black-box system from observations enables model-based testing (MBT). We take a recent approach using decision tree learning to create a model of a black-box system and discuss the usage of such a decision tree model for test generation. In this scope, we define a test coverage metric for decision tree models. Furthermore, we identify different modes of testing and explain that a decision tree model especially facilitates model-based testing for black-box systems with limited controllability of inputs and the inability to reset the system to a specific state. A case study on a discrete system illustrates our MBT approach.
Subjects
Automatic Test Generation
Decision Trees
Model Learning
Test Coverage
MLE@TUHH