TUHH Open Research
Help
  • Log In
    New user? Click here to register.Have you forgotten your password?
  • English
  • Deutsch
  • Communities & Collections
  • Publications
  • Research Data
  • People
  • Institutions
  • Projects
  • Statistics
  1. Home
  2. TUHH
  3. Publication References
  4. Comparison of high resolution patterning technologies for LTCC microwave circuits
 
Options

Comparison of high resolution patterning technologies for LTCC microwave circuits

Publikationstyp
Conference Paper
Date Issued
2007
Sprache
English
Author(s)
Müller, Jens  
Perrone, Rubén Ariel  
Drüe, Karl-Heinz  
Stephan, Ralf  
Trabert, Johannes  
Hein, Matthias  
Schwanke, Dieter  
Pohlner, Jürgen  
Reppe, Günter  
Kulke, Reinhard  
Uhlig, Peter  
Jacob, Arne  
Baras, Torben  
Molke, Alexander  
Institut
Hochfrequenztechnik E-3  
TORE-URI
http://hdl.handle.net/11420/10903
Start Page
98
End Page
103
Citation
Proceedings of the IMAPS/ACerS 3rd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT 2007) : April 23 - 26, 2007, Grand Hyatt Hotel, Denver, Colorado / International Microelectronics and Packaging Society (IMAPS); American Ceramic Society (ACerS). - Washington, DC, 2007. - Pp. 98-103
Contribution to Conference
3rd International Conference on Ceramic Interconnect and Ceramic Microsystems Technologies, CICMT 2007  
Publisher
International Microelectronics and Packaging Society
Is Part Of
isbn: 0-930815-81-5
DDC Class
600: Technik
620: Ingenieurwissenschaften
TUHH
Weiterführende Links
  • Contact
  • Send Feedback
  • Cookie settings
  • Privacy policy
  • Impress
DSpace Software

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science
Design by effective webwork GmbH

  • Deutsche NationalbibliothekDeutsche Nationalbibliothek
  • ORCiD Member OrganizationORCiD Member Organization
  • DataCiteDataCite
  • Re3DataRe3Data
  • OpenDOAROpenDOAR
  • OpenAireOpenAire
  • BASE Bielefeld Academic Search EngineBASE Bielefeld Academic Search Engine
Feedback