Study of structural changes of tellurium thin films on polymer substrates by electrical measurements and transmission electron microscopy

Journal
Thin solid films  
Volume
245
Issue
1-2
Start Page
272
End Page
276
Citation
Thin Solid Films 245 (1-2) : 272-276 (1994-06-01)
Publisher DOI
10.1016/0040-6090(94)90909-1
Scopus ID
2-s2.0-0028445458
In-situ electrical measurements and transmission electron microscopy observations of tellurium ultrathin films evaporated onto poly(1-butene) substrates have been correlated. A surprising increase of the current through the deposits of 1-2 orders of magnitude directly after deposition were found. In a system with constant mass we consider that structural changes in the deposit are responsible for this behaviour. Micrographs of the structure of the deposit support this idea by providing evidence of mutual coalescence. A further increase of the current by 1-2 orders of magnitude in 2 h can be explained by a continuous crystallization of the initially amorphous tellurium layer.