An Accurate Free Space Method for Material Characterization in W- Band Using Material Samples with Two Different Thicknesses

Start Page
202
End Page
205
Article Number
8541437
Citation
European Microwave Conference, EuMC: 8541437 (2018-11-20)
Contribution to Conference
48th European Microwave Conference, EuMC 2018  
Publisher DOI
10.23919/EuMC.2018.8541437
This paper presents an accurate free space method for material characterization eliminating the problem of the required precise orientation between the material and the antennas and expanding the unambiguous range for electrical thick samples. It includes theoretical considerations and measurement results of four different materials. Overall, a maximum measurement uncertainty of 0.0153 for the relative permittivity and 0.001 for the loss tangent in the W-band can be achieved. Depending on the variation of the material's thickness, the implemented setup changes lead to an reduction of the measurement uncertainty of 8 to 58 %.
Subjects
dielectric materials
materials nondestructive testing
microwave measurement
permittivity