Options
Substrate integrated resonant near-field sensor for material characterization
Publikationstyp
Conference Paper
Date Issued
2010-05
Sprache
English
Author(s)
Institut
TORE-URI
Start Page
628
End Page
631
Article Number
11452914
Citation
IEEE MTT-S International Microwave Symposium (2010)
Contribution to Conference
Publisher DOI
A compact near-field sensor for material characterization is proposed. It is composed of a substrate integrated waveguide resonator with coplanar waveguide interfaces, thus enabling easy integration and advanced multilayer technology. The material under test (MUT) is sensed by a tiny tip protruding from the resonator. If placed near this tip the MUT sensitively detunes the sensor. The response can be translated into precise, local permittivity information. As simulation shows microscopic applications seem possible thanks to the near-field character and the small effective scanning volume of the sensor. Measurements at X- and K-band frequencies confirm the general functioning of the sensor and demonstrate good principal agreement with simulation.