Quantifying the impact of RF probing variability on TRL calibration for LTCC substrates

Publikationstyp
Conference Paper
Date Issued
2019-05
Sprache
English
Author(s)
Yildiz, Ömer Faruk  
Dahl, David  
Schuster, Christian  
Institut
Theoretische Elektrotechnik E-18  
TORE-URI
http://hdl.handle.net/11420/3452
Volume
2019-May
Start Page
2240
End Page
2245
Article Number
8811127
Citation
Electronic Components and Technology Conference : 8811127 (2019-05)
Contribution to Conference
Electronic Components and Technology Conference 2019  
Publisher DOI
10.1109/ECTC.2019.00-11
Scopus ID
2-s2.0-85072286459
When conducting radio frequency (RF) measurements using microwave probes, slight misplacements of the probing tips introduce errors and deteriorate measurement results, especially in the case of manual probing. For this reason, short transmission lines in combination with polynomial chaos expansion (PCE) are used to model the imperfect conncections between probes and launching structures, and to quantify the impact of probing inaccuracies on the thru-reflect-line (TRL) calibration technique. The analysis is accompanied by a comparison between PCE and Monte Carlo sampling (MCS) in order to assess the accuracy of the proposed method. Additionally, a set of microstrip TRL standards are manufactured on a low temperature cofired ceramic (LTCC) substrate and subsequently measured in the frequency range from 0.05 to 50 GHz for the purpose of studying the correlation with the underlying PCE model.
Subjects
Low temperature cofired ceramics
Microwave probing
Polynomial chaos expansion
Probing variability
Thru reflect line calibration