On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD)

The work presented aims at determining the optimum physical resolution of the transmission-electron backscattered diffraction (t-EBSD) technique. The resolution depends critically on intrinsic factors such as the density, atomic number and thickness of the specimen but also on the extrinsic experimental set-up of the electron beam voltage, specimen tilt and detector position. In the present study, the so-called physical resolution of a typical t-EBSD set-up was determined with the use of Monte Carlo simulations and confronted to experimental findings. In the case of a thin Au film of 20. nm, the best resolution obtained was 9. nm whereas for a 100. nm. Au film the best resolution was 66. nm. The precise dependence of resolution on thickness was found to vary differently depending on the specific elements involved. This means that the resolution of each specimen should be determined individually. Experimentally the median probe size of the t-EBSD for a 140. nm thick AuAg specimen was measured to be 87. nm. The first and third quartiles of the probe size measurements were found to be 60. nm and 118. nm. Simulation of this specimen resulted in a resolution of 94. nm which fits between these quartiles.

Subjects

Monte Carlo simulation

Resolution

Transmission electron back scatter diffraction

DDC Class

530: Physik

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On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD)